Random access transport capacity
نویسندگان
چکیده
منابع مشابه
Random access transport capacity of multihop AF relaying: a throughput-reliability tradeoff
To determine the capacity of distributed wireless networks (i.e., ad hoc networks), the random access transport capacity was proposed as the average maximum rate of successful end-to-end transmission in the distance. In this article, we consider the random access transport capacity for multihop relaying to find the end-to-end throughput of a wireless ad hoc network, where each node relays the s...
متن کاملNeural Random-Access Machines
In this paper, we propose and investigate a new neural network architecture called Neural Random Access Machine. It can manipulate and dereference pointers to an external variable-size random-access memory. The model is trained from pure input-output examples using backpropagation. We evaluate the new model on a number of simple algorithmic tasks whose solutions require pointer manipulation and...
متن کاملRandom Access Photonic Metamaterials
We demonstrate the first addressable reconfigurable photonic metamaterials thus enabling control over optical material properties with simultaneous spatial and temporal resolution. Potential applications of random access metadevices include active focusing, beam steering, dynamic transformation optics and video holography.
متن کاملHolographic Random Access Memory
We examine the primary challenges for building a practical and competitive holographic random access memory (HRAM) system, specifically for size, speed, and cost. We show that a fast HRAM system can be implemented with a compact architecture by incorporating conjugate readout, a pixel-matched sensor array, and a linear array of laser diodes. It provides faster random access time than hard disk ...
متن کاملStatic Random Access Memories
Testing static random access memories (SRAM’s) for all possible failures is not feasible. We have to restrict the class of faults to he considered. This restricted class is called a fault model. A fault model for SRAM’s is presented based on physical spot defects, which are modeled as local disturbances in the layout of an SRAM. Two linear test algorithms are proposed, that cover 100% of the fa...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Wireless Communications
سال: 2010
ISSN: 1536-1276
DOI: 10.1109/twc.2010.06.091432